Rozgonyi, George A.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

Thermal Misfit Strain Relaxation in Ge/(001)Si Heterostructures

Bharathan, Jayesh, Zhou, Honghui, Narayan, Jagdish, Rozgonyi, George, Bulman, Gary E.

Journal:

Journal of Electronic Materials

Year:

2014

Language:

english

File:

PDF, 763 KB

english, 2014

2

The influence of hydrogenation on the electrical properties of impurity-contaminated silicon grain boundaries

Park, Yongkook, Lu, Jinggang, Park, Jin-Hong, Rozgonyi, George

Journal:

Electronic Materials Letters

Year:

2015

Language:

english

File:

PDF, 584 KB

english, 2015

3

Solid State Interaction and Nano-Scale Silicide Formation for Co/Ti Multilayers on Silicon

Hong, Feng, Patnaik, Bijoy K., Rozgonyi, George A.

Journal:

MRS Proceedings

Year:

1992

Language:

english

File:

PDF, 1.99 MB

english, 1992

4

[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - DLTS of ALD HfO

Yu, Liya, George Rozgonyi, George, Shrestha, Pragya, Gu, Diefeng, Baumgart, Helmut

Year:

2009

Language:

english

File:

PDF, 776 KB

english, 2009

5

ECS Transactions [ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] - In-Situ Electrical Measurements of Thin Photovoltaic Silicon Wafers during Nanoindentation

Kulshreshtha, Prashant K., Youssef, Khaled, Rozgonyi, George, Stromberg, Ryan J., Nay, Richard

Year:

2010

Language:

english

File:

PDF, 65.79 MB

english, 2010

6

Casting Single Crystal Silicon: Novel Defect Profiles from BP Solar's Mono2 TM Wafers

Stoddard, Nathan, Wu, Bei, Witting, Ian, Wagener, Magnus C., Park, Yongkook, Rozgonyi, George A., Clark, Roger

Journal:

Solid State Phenomena

Year:

2008

Language:

english

File:

PDF, 856 KB

english, 2008

7

[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Deep Level Transient Spectroscopy Study of Dislocations and Related Defects in SiGe/Si Heterostructures

Lu, Jinggang, Park, Yongkook, Rozgonyi, George

Year:

2007

Language:

english

File:

PDF, 428 KB

english, 2007

8

Phase Transformation of Co Silicidation in the Co/Ti- and Ti/Co-Si(100) Systems

Hong, Feng, Patnaik, Bijoy K., Li, Bingzong, Liu, Ping, Sun, Zen, Rozgonyi, George A.

Journal:

MRS Proceedings

Year:

1993

Language:

english

File:

PDF, 1.64 MB

english, 1993

9

Reference Module in Materials Science and Materials Engineering || Silicon: Characterization by Etching ☆

Rozgonyi, George A.

Year:

2017

Language:

english

File:

PDF, 1.20 MB

english, 2017

10

Carrier lifetime and x-ray imaging correlations of an oxide-induced stacking fault ring and its gettering behavior in Czochralski silicon

Raebiger, Jan, Romanowski, Andrzej, Zhang, Qiung, Rozgonyi, George

Journal:

Applied Physics Letters

Year:

1996

Language:

english

File:

PDF, 663 KB

english, 1996

11

[ECS 209th ECS Meeting - Denver, Colorado (May 7-May 12, 2006)] ECS Transactions - Threading vs Misfit Dislocations in Strained Si/SiGe Heterostructures: Preferential Etching and Minority Carrier Transient Spectroscopy

Lu, Jinggang, Zhang, Renhua, Rozgonyi, George, Yakimov, Eugene, Yarykin, Nikolai, Seacrist, Mike

Year:

2006

Language:

english

File:

PDF, 802 KB

english, 2006

12

The Gettering and Electrical Activity of Ni, Au, and Cu in Epitaxial Si/Si(2%Ge)/Si during RTA

Zhou, Tian-Qun, Buczkowski, Andrzej, Radzimski, Zbigniew, Rozgonyi, George A.

Journal:

MRS Proceedings

Year:

1991

Language:

english

File:

PDF, 3.61 MB

english, 1991

13

Mechanisms of epitaxial CoSi2 formation in the multilayer Co/Ti-Si(100) system

Hong, Feng, Rozgonyi, George A., Patnaik, Bijoy K.

Journal:

Applied Physics Letters

Year:

1994

Language:

english

File:

PDF, 664 KB

english, 1994

14

Defect Electrical Activity Study Using a Si(Ge) Heteroepitaxial Structure

Radzimski, Zbigniew J., Buczkowski, A., Rozgonyi, George A.

Journal:

Solid State Phenomena

Year:

1993

Language:

english

File:

PDF, 612 KB

english, 1993

15

Defect Engineering for ULSI Epitaxial Silicon

Rozgonyi, George A., Kola, R.R.

Journal:

Solid State Phenomena

Year:

1989

Language:

english

File:

PDF, 951 KB

english, 1989

16

Temperature Dependent Recombination Lifetime in Silicon: Influence of Trap Level

Buczkowski, Andrzej, Radzimski, Zbigniew J., Kirino, Yoshi, Shimura, Fumio, Rozgonyi, George A.

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 303 KB

english, 1990

17

CoSi2 Formation Through Co/Ti Multilayer Reacting with Si-(100) Substrate

Hong, Feng, Patnaik, Bijoy, Rozgonyi, George A.

Journal:

MRS Proceedings

Year:

1991

Language:

english

File:

PDF, 2.69 MB

english, 1991

18

Oxygen diffusion in heavily antimony-, arsenic-, and boron-doped Czochralski silicon wafers

Ono, Toshiaki, Rozgonyi, George A., Asayama, Eiichi, Horie, Hiroshi, Tsuya, Hideki, Sueoka, Koji

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 277 KB

english, 1999

19

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Effect of Strained-Si Layer Thickness on Dislocation Distribution and SiGe Relaxation in Thin Buffer Layer Strained-Si/SiGe Heterostructures

Lu, Jinggang, Rozgonyi, George, Seacrist, Mike

Year:

2008

Language:

english

File:

PDF, 589 KB

english, 2008

20

[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Evaluation of Hybrid-Orientation (110)/(100) Direct Silicon Bonded Interfaces

Wagener, Magnus C., Seacrist, Mike, Rozgonyi, George

Year:

2007

Language:

english

File:

PDF, 522 KB

english, 2007

21

In-Situ Photoexcitation-Induced Perturbations of Defect Complex Concentration and Distribution in Silicon Implanted with Light and Heavy Ions

Yarykin, Nikolai, Cho, C.R., Zuhr, R.A., Rozgonyi, George A.

Journal:

Solid State Phenomena

Year:

1999

File:

PDF, 439 KB

1999

22

Electron Beam Induced Current Imaging of Silicon Oxide Damage Due to Reactive Ion Etching

Kirk, Hary, Radzimski, Zbigniew J., Romanowski, A., Rozgonyi, George A.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 784 KB

1996

23

Poisson Ratio of Epitaxial Germanium Films Grown on Silicon

Jayesh Bharathan, Jagdish Narayan, George Rozgonyi, Gary E. Bulman

Journal:

Journal of Electronic Materials

Year:

2013

Language:

english

File:

PDF, 500 KB

english, 2013

24

Modulation of electrical characteristics at a Ni-contaminated silicon grain boundary by engineering the metal precipitates

Jiang, Tingting, Yu, Xuegong, Gu, Xin, Rozgonyi, George, Yang, Deren

Journal:

phys stat sol (a)

Year:

2013

Language:

english

File:

PDF, 334 KB

english, 2013

25

Modulation of 1.5 μm dislocation-related luminescence emitted from a direct silicon bonded interface by external bias

Yu, Xuegong, Song, Lihui, Yang, Deren, Kittler, Martin, Rozgonyi, George A.

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 847 KB

english, 2010

26

Impact of thermal annealing on deep-level defects in strained-Si∕SiGe heterostructure

Zhang, Renhua, Rozgonyi, George A., Yakimov, Eugene, Yarykin, Nikolai, Seacrist, Mike

Journal:

Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 688 KB

english, 2008

27

Gettering of iron in silicon-on-insulator wafers

Beaman, Kevin L., Agarwal, Aditya, Kononchuk, Oleg, Koveshnikov, Sergei, Bondarenko, Irina, Rozgonyi, George A.

Journal:

Applied Physics Letters

Year:

1997

Language:

english

File:

PDF, 465 KB

english, 1997

28

Oxygen and Carbon Precipitation in Crystalline Sheet Silicon

Lu, Jinggang, Rozgonyi, George

Journal:

Journal of The Electrochemical Society

Year:

2006

Language:

english

File:

PDF, 335 KB

english, 2006

29

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Characterization of strained-Si/SiGe/Si heterostructures with capacitance methods

Yarykin, Nikolai, Zhang, Renhua, Rozgonyi, George, Valiev, Kamil A., Orlikovsky, Alexander A.

Year:

2012

Language:

english

File:

PDF, 245 KB

english, 2012

30

Hydrogen Induced Defects at Silicon Surfaces and Buried Epitaxial Misfit Dislocation Interfaces

Zhou, Tian-Qun, Radzimski, Zbigniew, Xiao, Zhigang, Sopori, Bhushan, Rozgonyi, George A.

Journal:

MRS Proceedings

Year:

1989

Language:

english

File:

PDF, 1.38 MB

english, 1989

31

Response to ‘‘Comment on ‘Iron diffusivity in silicon: Impact of charge state’ ’’ [Appl. Phys. Lett. 68, 1868 (1996)]

Koveshnikov, Sergei, Rozgonyi, George

Journal:

Applied Physics Letters

Year:

1996

Language:

english

File:

PDF, 227 KB

english, 1996

32

Iron diffusivity in silicon: Impact of charge state

Koveshnikov, Sergei V., Rozgonyi, George A.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 274 KB

english, 1995

33

EBIC Study of Electrical Activity of Stacking Faults in Multicrystalline Sheet Silicon

Lu, Jinggang, Rozgonyi, George A., Rand, James, Jonczyk, Ralf

Journal:

Solid State Phenomena

Year:

2005

Language:

english

File:

PDF, 2.31 MB

english, 2005

34

Measurements of Diffusion Length in Si-SiGe Structures

Kononchuk, O.V., Rozgonyi, George A., Yakimov, E.B.

Journal:

Solid State Phenomena

Year:

1996

File:

PDF, 345 KB

1996

35

Silicon PV Wafers: Mechanical Strength and Correlations with Defects and Stress

Rozgonyi, George A., Youssef, Khaled M., Kulshreshtha, P., Shi, M., Good, Ethan

Journal:

Solid State Phenomena

Year:

2011

Language:

english

File:

PDF, 1.79 MB

english, 2011

36

Medium Field Breakdown Origin on Metal Oxide Semiconductor Capacitor Containing Grown-in Czochralski Silicon Crystal Defects

Tamatsuka, Masaro, Radzimski, Zbigniew, Rozgonyi, George A., Oka, Satoshi, Kato, Masahiro, Kitagawara, Yutaka

Journal:

Japanese Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 52 KB

english, 1998

37

Interfacial Morphology of Selicides Formed Via Rta of Sputtered Bi- and Multi-Layer Co/Ti(O,C) on Si

Hong, Feng, Patnaik, Bijoy K., Li, Bingzong, Liu, Ping, Sun, Zen, Rozgonyi, George A.

Journal:

MRS Proceedings

Year:

1992

Language:

english

File:

PDF, 1.57 MB

english, 1992

38

Effect of oxygen and associated residual stresses on the mechanical properties of high growth rate Czochralski silicon

Youssef, Khaled, Shi, Meirong, Radue, Chantelle, Good, Ethan, Rozgonyi, George

Journal:

Journal of Applied Physics

Year:

2013

Language:

english

File:

PDF, 1.80 MB

english, 2013

39

Microstructure and electrical properties of high power laser thermal annealing on inkjet-printed Ag films

Yo Han Yoon, Seol-Min Yi, Jung-Ryoul Yim, Ji-Hoon Lee, George Rozgonyi, Young-Chang Joo

Journal:

Microelectronic Engineering

Year:

2010

Language:

english

File:

PDF, 458 KB

english, 2010

40

Hydrogenation of interface states at a clean grain boundary in the direct silicon bonded wafer

Tingting Jiang, Xuegong Yu, Xin Gu, Deren Yang, George Rozgonyi

Journal:

physica status solidi (a)

Year:

2012

Language:

english

File:

PDF, 378 KB

english, 2012

41

Deep level transient spectroscopy and minority carrier lifetime study on Ga-doped continuous Czochralski silicon

Yoon, Yohan, Yan, Yixin, Ostrom, Nels P., Kim, Jinwoo, Rozgonyi, George

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 852 KB

english, 2012

42

Effects of grain boundary on impurity gettering and oxygen precipitation in polycrystalline sheet silicon

Lu, Jinggang, Wagener, Magnus, Rozgonyi, George, Rand, James, Jonczyk, Ralf

Journal:

Journal of Applied Physics

Year:

2003

Language:

english

File:

PDF, 645 KB

english, 2003

43

DRAM Wafer Qualification Issues: Oxide Integrity vs. D-Defects, Oxygen Precipitates and High Temperature Annealing

Park, J.G., Rozgonyi, George A.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 1.60 MB

english, 1996

44

ECS Transactions [ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] - Amorphization during Fracture of Thin Photovoltaic Silicon Wafers

Youssef, Khaled, Kulshreshtha, Prashant K., Rozgonyi, George

Year:

2010

Language:

english

File:

PDF, 1.61 MB

english, 2010

45

Capacitance transient and current-/capacitance-voltage study of direct silicon bonded (110)∕(100) interface

Yu, Xuegong, Lu, Jinggang, Rozgonyi, George

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 534 KB

english, 2008

46

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - MOS Capacitor Evaluation of Deep States at the Interfacial Grain Boundary in (110/100) Bonded Silicon

Yu, Liya, Lu, Jinggang, Wagener, Magnus, Yu, Xuegong, Rozgonyi, George

Year:

2008

Language:

english

File:

PDF, 302 KB

english, 2008

47

ECS Transactions [ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] - In-Situ Electrical Measurements of Thin Photovoltaic Silicon Wafers during Nanoindentation

Kulshreshtha, Prashant K., Youssef, Khaled, Rozgonyi, George, Stromberg, Ryan J., Nay, Richard

Year:

2010

File:

PDF, 65.79 MB

2010

48

Understanding the effect of impurities and grain boundaries on mechanical behavior of Si via nanoindentation of (110)/(100) direct Si bonded wafers

Youssef, Khaled, Yu, Xuegong, Seacrist, Mike, Rozgonyi, George

Journal:

Journal of Materials Research

Year:

2012

Language:

english

File:

PDF, 461 KB

english, 2012

49

Defect Engineering for Silicon-on-Insulator, MeV Implantation and Low Temperature Processing

Koveshnikov, Sergei V., Agarwal, Anant, Beaman, K.L., Rozgonyi, George A.

Journal:

Solid State Phenomena

Year:

1996

Language:

english

File:

PDF, 802 KB

english, 1996

50

Passivation of hybrid-orientation direct silicon bonded interfaces

Magnus C. Wagener, Mike Seacrist, George A. Rozgonyi

Journal:

Physica B: Condensed Matter

Year:

2007

Language:

english

File:

PDF, 279 KB

english, 2007

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски